منابع مشابه
the scanning electron microscope
it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...
متن کاملThe Scanning Confocal Electron Microscope
The Scanning Confocal Electron Microscope, is an instrument which permits the observation and characterization of sub-surface structures of thick, optically opaque materials at nanometer level resolutions. The instrument merges the capabilities of the scanning, transmission and x-ray microscopes, and achieves unprecedented resolutions in optically dense materials, by implementing the technology...
متن کاملDental Wear: A Scanning Electron Microscope Study
Dental wear can be differentiated into different types on the basis of morphological and etiological factors. The present research was carried out on twelve extracted human teeth with dental wear (three teeth showing each type of wear: erosion, attrition, abrasion, and abfraction) studied by scanning electron microscopy (SEM). The study aimed, through analysis of the macro- and micromorphologic...
متن کاملMultibeam scanning electron microscope: Experimental results
The authors present the first results obtained with their multibeam scanning electron microscope. For the first time, they were able to image 196 array of 14 14 focused beams of a multielectron beam source on a specimen using single beam scanning electron microscope SEM optics. The system consists of an FEI Novanano 200 SEM optics column equipped with a multielectron beam source module. The sou...
متن کاملCritical Issues in Scanning Electron Microscope Metrology
National Institute of Standards and Technology, Gaithersburg, MD 20899-0001 During the manufacturing of presentday integrated circuits, certain measurements must be made of the submicrometer structures composing the device with a high degree of repeatability. Optical microscopy, scanning electron microscopy, and the various forms of scanning probe microscopies are major microscopical techniques...
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ژورنال
عنوان ژورنال: Microscopy Today
سال: 1993
ISSN: 1551-9295,2150-3583
DOI: 10.1017/s1551929500069339